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    Parametric Testing

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    FS800

    Device Parameter Analyzer

    Parameter Testing Reliability Testing High-Speed Pulse Measurement

    FS800 Device Parameter Analyzer is a multi-functional  electrical characterization instrument.

    • Customizable and expandable IV, CV, low-frequency noise testing, and ultra-fast IV measurement capabilities to meet almost all testing requirements

    • Flexible modular architecture with the semiconductor characterization system mainframe and plug-in modules, providing a single-box solution for wafer-level automated testing

    • Support up to 24 SMUs or 132 channels switch matrix

    • Support multi-channel and multi-site parallel testing

    • The Built-in professional testing software LabExpress offers intuitive GUI interface with 18.5-inch touch screen, featuring rich ready-to-use library of application tests and powerful data analysis functionalities, while also supporting customizable algorithm, test flow and complex calculation

    • Wide test applications for semiconductor devices, LED materials, 2D materials, nano-materials, and novel devices

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    Highlights

    • Powerful Capability

      Wide bias range and high precision
      High-speed sampling time-domain signal acquisition
      Arbitrary linear waveform generation

    • All-In-One Solution

      A single-box solution that covers
      all-around device parametric testing applications
      IV, CV, transient IV sampling, high-speed
      waveform generation & measurement

    • High Scalability

      Supports installing up to 24 SMUs
      or 132-channel switch matrix,
      Supports hybrid architecture of
      SMU and switch matrix

    • Efficiency

      Supports automated testing of
      wafer-level electrical parameters
      in a single instrument
      Supports parallel testing

    • Easy to Use

      Built-in LabExpress testing software
      rich ready-to-use algorithm presets,
      data analysis tools
      and flexible customization

    Applications

    • Process development
      & device parameter testing

    • Semiconductor
      device reliability
      testing

    • Semiconductor
      device ultrashort
      pulse testing

    • Non-Volatile
      Memory

    • Opto-electronic
      device & MEMS measurement

    • 2D materials
      device testing

    • Metal material
      testing

    • Advanced materials
      and device testing

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