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    Noise Measurement

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    9813DXC

    Advanced Low Frequency Noise Measurement System

    Low Frequency Noise 1/f Noise & RTN High-Accuracy & Wide-Range

    9813DXC excels in fast, high-resolution low frequency noise measurement for diverse requirements, helping chip manufacturers identify and eliminate defects for reliable, high-performance chips.

    • Accommodate a complete range of measurement conditions for both high and low impedance devices, ranging from 10Ω to 10MΩ

    • Delivers a significant and innovative improvement in hardware and software design to meet the challenge of explosive growth requirements for low frequency noise test of advanced technology nodes, especially FinFET technology

    • Used in conjunction with the Primarius semiconductor parameter testing system FS-Pro, providing a parallel testing framework solution that significantly improves testing efficiency and throughput

    • Applies for 14/10/7/5nm technology node

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    Highlights

    • Ultimate Resolution

      Multiple built-in LNAs
      provide the widest impedance matching range

    • Full Coverage

      MOSFET, SOI, FinFET, TFT, HV/LDMOS, BJT/HBT,
      JFET, Diode, Resistor, Packaged IC, etc.

    • Parallel Testing

      Significantly improve
      testing efficiency and throughput

    • High Speed

      20 sec/bias for typical device 1/f noise

    • Innovative Architecture

      Integrated system architecture

    • Easy-to-Use

      Intuitive touch screen for easy operation

    Applications

    • Process development
      quality assessment
      & quality control

    • Noise characterization for SPICE model extraction

    • Design
      performance
      optimization

    • Semiconductor
      physics & materials
      research

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